Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• techniques to yield multidimensional data sets and aid in isolation of the influence of electrostatic potential, for example, PeakForce infrared-KPFM (PFIR-KPFM) [66], nanomechanical mapping + KPFM [67][68], magnetic force microscopy (MFM) + KPFM [69], piezoresponse force microscopy (PFM) + KPFM [70], and G

Cantilever signature of tip detachment during contact resonance AFM

• Devin Kalafut,
• Ryan Wagner,
• Maria Jose Cadena,
• Anil Bajaj and
• Arvind Raman

Beilstein J. Nanotechnol. 2021, 12, 1286–1296, doi:10.3762/bjnano.12.96

• Devin Kalafut Ryan Wagner Maria Jose Cadena Anil Bajaj Arvind Raman School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA 10.3762/bjnano.12.96 Abstract Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are

• connect the qualitative and quantitative behavior to experimental features. Keywords: atomic force microscopy (AFM); contact resonance; nonlinear normal mode (NNM); tip–sample detachment; photothermal excitation; Introduction Contact resonance atomic force microscopy (CR-AFM) [1][2], piezoresponse force

• microscopy (PFM) [3], and electrochemical strain microscopy (ESM) [4] are atomic force microscopy (AFM) [5] methods where the probe tip is held in contact with the sample at a constant average force while a small superimposed vibrational response is monitored. CR-AFM can measure the viscoelastic properties

Enhancement of the piezoelectric coefficient in PVDF-TrFe/CoFe₂O₄ nanocomposites through DC magnetic poling

• Marco Fortunato,
• Alessio Tamburrano,
• Maria Paola Bracciale,
• Maria Laura Santarelli and
• Maria Sabrina Sarto

Beilstein J. Nanotechnol. 2021, 12, 1262–1270, doi:10.3762/bjnano.12.93

• poling; piezoelectric effect; piezoresponse force microscopy (PFM); poly(vinylidene fluoride-co-trifluoroethylene); PVDF-TrFe; PVDF-TrFe nanocomposites; Introduction In the last years, innovative energy harvesting systems based on the piezoelectric effect, able to convert vibrational mechanical energy

• piezoelectric coefficient was evaluated through piezoresponse force microscopy (PFM), which is a very powerful technique to characterize the micro- and nanoscale piezoelectric response of piezoelectric materials [1][2][4][26][27]. Results and Discussion In order to understand whether the β phase fraction was

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• conditions for band-excitation piezoresponse force microscopy (PFM) [134]. Band excitation collects a band of frequencies around the contact resonance frequency of the tip–sample system, which is modeled by a simple harmonic oscillator equation. This allows for the determination of several physical

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• tip-independent ESM signal intensity decrease in the aged sample. Several groups link the ESM signal intensity to the electrochemical activity of Li-ions [33][36][42][43][44][58][60][61], following the approach applied for the analysis of the piezoresponse force microscopy (PFM), for which the signal

Template-controlled piezoactivity of ZnO thin films grown via a bioinspired approach

• Nina J. Blumenstein,
• Fabian Streb,
• Stefan Walheim,
• Thomas Schimmel,
• Zaklina Burghard and
• Joachim Bill

Beilstein J. Nanotechnol. 2017, 8, 296–303, doi:10.3762/bjnano.8.32

• polyelectrolyte leads to texturing of the ZnO film. This texture enables a piezoelectric performance of the material which was measured by piezoresponse force microscopy. This study shows that it is possible to tune the piezoelectric properties of ZnO by applying templates with different functionalities

• . Keywords: piezoresponse force microscopy; template-controlled deposition; ZnO; Introduction Zinc oxide is a wide band gap semiconductor. Thin films of it can be applied in, e.g., LEDs [1][2][3] or transistors [4][5][6]. Furthermore, due to its piezoelectricity, it can be incorporated in actuators [7] or

• water-free reaction solution. The first template is a carboxy-terminated SAM, the second consists of a PEL with polystyrene sulfonate (PSS) as a top layer. The grown ZnO thin films are characterized with piezoresponse force microscopy (PFM) to investigate the influence of the templates on the